Bog
Next generation halt and hass robust design of electronics and systems a new approach to discovering and correcting systems reliability risks next generation halt and hass presents a major paradigm shift from reliability prediction-based methods to discov...
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Mærke: John J. Paschkewitz og Kirk A. Gray
Køn: eng
Forsendelsesomkostninger: 0,00 kr.
Leveringstid: 2-3 hverdage
